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10.9.2 ODT DC Electrical Characteristics
An overview about the specification requirements for R TT and ΔV M is provided in Table 32.
Table 32 – ODT DC Impedance and Mid-Level Requirements
MR1 A9, A6, A2
0, 1, 0
0, 0, 1
0, 1, 1
1, 0, 1
1, 0, 0
R TT
120 Ω
6 0 Ω
4 0 Ω
3 0 Ω
2 0 Ω
Resistor
R TT 120
R TT 60
R TT 40
R TT 30
R TT 20
V out
V IL(AC) to V IH(AC)
Min.
0.9
0.9
0.9
0.9
0.9
Nom.
1.0
1.0
1.0
1.0
1.0
Max.
1.6
1.6
1.6
1.6
1.6
Unit
R ZQ /2
R ZQ /4
R ZQ /6
R ZQ /8
R ZQ /12
Notes
1, 2, 3, 4
1, 2, 3, 4
1, 2, 3, 4
1, 2, 3, 4
1, 2, 3, 4
Deviation of V M with respect to V DDQ /2, ΔV M
-5
+5
%
1, 2, 3, 4, 5
Notes:
1. With RZQ = 240 Ω .
2. The tolerance limits are specified after calibration with stable voltage and temperature. For the behavior of the tolerance
limits if temperature or voltage changes after calibration, see the following section ODT temperature and voltage sensitivity.
3. The tolerance limits are specified under the condition that V DDQ = V DD and that V SSQ = V SS .
4. Measurement definition for R TT :
Apply V IH(AC) to pin under test and measure current I(V IH(AC) ), then apply V IL(AC) to pin under test and measure current
I(V IL(AC) ) respectively. Calculate R TT as follows:
R TT = [V IH(AC) - V IL(AC) ] / [I (V IH(AC) ) - I (V IL(AC) )]
5. Measurement definition for V M and Δ V M :
Measure voltage (V M ) at test pin (midpoint) with no load. Calculate ΔV M as follows:
ΔV M = (2 × V M / V DDQ - 1) × 100%.
10.9.3 ODT Temperature and Voltage sensitivity
If temperature and/or voltage change after calibration, the tolerance limits widen according to Table 33
and Table 34. The following definitions are used:
Δ T = T - T (@calibration); Δ V = V DDQ - V DDQ (@calibration); V DD = V DDQ
Table 33 – ODT Sensitivity Definition
SYMBOL
R TT
MIN.
0.9 - dR TT dT × |ΔT| - dR TT dV × |ΔV|
MAX.
1.6 + dR TT dT × |ΔT| + dR TT dV × |ΔV|
UNIT
RZQ/2,4,6,8,12
Table 34 – ODT Voltage and Temperature Sensitivity
SYMBOL
dR TT dT
dR TT dV
MIN.
0
0
MAX.
1.5
0.15
UNIT
%/°C
%/mV
Note: These parameters may not be subject to production test. They are verified by design and characterization
Publication Release Date: Dec. 09, 2013
Revision A05
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